hewlett-packard UNITED STATES
Skip site-wide navigation link group hewlett-packard home products and services support solutions how to buy
hewlett-packard logo with invent tag line - jump to hp.com home page
End of site-wide navigation link group
 
printable version
hp journal online
hp labs skip lorem ipsum dolor navigation menu link group
search
contact hp
in this issue
table of contents
about the cover
what's ahead
online issues
hp journal home
hp labs home
about hp labs
research
news and events
careers @ labs
technical reports
worldwide sites
end of lorem ipsum dolor navigation menu link group
go to article skip lorem ipsum dolor navigation menu link group
1 2 3 4 5
6 7 8 9 10
11 12 13 14 15
16 17
end of lorem ipsum dolor navigation menu link group
February 1995, Article 17

Better Models or Better Algorithms? Techniques to Improve Fault Diagnosis

The simple stuck-at fault model paired with a complex fault diagnosis algorithm is compared against the bridging fault model paired with a simple fault diagnosis algorithm to determine which approach produces the best fault diagnosis in CMOS VLSI circuits.

by Robert C. Aitken and Peter C. Maxwell


Article 17 - feb95a17.pdf

Bridging and Stuck-At Faults - feb95a17a.pdf

Potential Detection - feb95a17b.pdf


This article is available in Adobe Acrobat format (PDF). To view this article you need to have Acrobat Reader 2.0 or later installed on your system. The Acrobat reader is available free of charge in Unix, Dos, Windows and Macintosh formats. You can download the reader from Adobe Systems (www.adobe.com)
Skip page footer
printable version
privacy statement using this site means you accept its terms © 1994-2002 hewlett-packard company
End of page footer