February 1995, Volume 46, Issue 1 Articles
	Broadband Frequency Characterization of Optical Receivers Using Intensity Noise by Douglas M. Baney, Wayne B. Soren
	Erbium-Doped Fiber Amplifier Test System by Edgar Leckel, Jurgen Sang, Rolf Muller, Clemens Ruck, and Christian Hentschel
	Multi-Quantum-Well Ridge Waveguide Lasers for Tunable External-Cavity Sources by Tirumala R. Ranganath, Michael J. Ludowise, Patricia A. Beck, Dennis J. Derickson, William H. Perez, Tim L. Bagwell, and David M. Braun
	Measurement of Polarization-Mode Dispersion, by Brian L. Heffner and Paul R. Hernday
	A New Design Approach for a Programmable Optical Attenuator by Siegmar Schmidt and Halmo Fischer
	Precision Reflectometer with Spurious-Free Enhanced Sensitivity, by David M. Braun, Dennis J. Derickson, Luis M. Fernandez, and Greg D. LeCheminant
	High-Power, Low-Internal-Reflection, Edge Emitting Light-Emitting Diodes by Dennis J. Derickson, Patricia A. Beck, Tim L. Bagwell, David M. Braun, Julie E. Fouquet, Forrest G. Kellert, Michael J. Ludowise, William H. Perez, Tirumala R. Ranganath, Gary R. Trott, and Susan R. Sloan
	Jitter Analysis of High-Speed Digital Systems by Christopher M. Miller and David J. McQuate
	Automation of Optical Time-Domain Reflectometry Measurements by Frank A. Maier and Harald Seeger
	Design and Performance of a Narrowband VCO at 282 THz by Peter R. Robrish, Christopher J. Madden, Rory L. VanTuyl, and William R. Trutna, Jr.
	Surface Emitting Laser for Multimode Data Link Applications by Michael R.T. Tan, Kenneth H. Hahn, Yu-Min D. Houng, and Shih-Yuan Wang
	Generating Short-Wavelength Light Using a Vertical-Cavity Laser Structure by Shigeru Nakagawa, Danny E. Mars, and Norihide Yamada
	A New, Flexible Sequencer Architecture for Testing Complex Serial Bit Streams by Robert E. McAuliffe, James L. Benson, and Christopher B. Cain
	Shortening the Time to Volume Production of High-Performance Standard Cell ASICs by Jay D. McDougal and William E. Young
	A Framework for Insight into the Impact of Interconnect on 0.35-mm VLSI Performance, by Prasad Raje
	Synthesis of 100% Delay Fault Testable Combinational Circuits by Cube Partitioning by William K. Lam
	Better Models or Better Algorithms? Techniques to Improve Fault Diagnosis, by Robert C. Aitken and Peter C. Maxwell