|  | 
		
	
	
  What technologies are needed to create and maintain the information superhighway? 
Certainly fiber optics will be one of them. Fiber-optic communications systems 
have the ability to transmit vast streams of data including voice (telephone 
conversations), video (TV channels), and data (computer networks). In fact, 
multimedia applications, in which voice, video, and data will be transmitted 
and displayed at the same time, will be highly desirable in the near future. 
As these services become more commonplace, the required network capacity will 
expand and current fiber-optic systems operating at data rates of hundreds 
of megabits per second will be superseded by those with rates near ten gigabits 
per second. Nationwide networks will give way to one that is much more international 
in scope. Currently, a large number of fiber-optic networks, operating at 155 
megabits per second and 622 megabits per second, are in operation in the U.S.A., 
Europe, and Japan and new installations of 2.4-gigabit-per-second networks 
are near completion.
 To support this high-speed, long-distance traffic, new technologies are 
rapidly evolving. Optical amplifiers based on rare-earth-doped optical fibers-for 
example, erbium-doped fiber amplifiers, or EDFAs-make it possible to overcome 
fiber loss and construct transparent undersea optical links thousands of kilometers 
long without electronic regenerators. These amplifiers can also be used as 
excellent noise sources to test optical components such as photodetectors (page
 6). In terrestrial systems, 
several signals at different wavelengths can be sent over the same fiber to 
increase capacity (wavelength division multiplexing), and their intensity can 
be boosted in a single EDFA. Accurately testing the amplifier performance is 
critical in these systems. The HP 81600 EDFA test system (page
 13) makes calibrated 
gain and noise figure measurements as a function of wavelength and optical 
power. This test system uses several high-performance lightwave products such 
as the HP 8168C tunable laser source and the HP 71450A optical spectrum analyzer 
in addition to a sophisticated software algorithm to measure the characteristics 
of optical amplifiers. These algorithms were designed and tested by a team 
consisting of engineers from California and Germany. To achieve a wide tuning 
range, the HP 8168C uses a new semiconductor laser chip that has been developed 
at HP Laboratories (Page
 20) using a quantum-well 
indium gallium arsenide (InGaAs) structure. This device also makes it possible 
to obtain sufficiently high optical input power to test amplifier saturation.
 Long fiber spans using optical amplifiers with no pulse reshaping compound 
subtle signal distortion in fiber. Particularly at high data rates, fiber polarization 
effects can increase dispersion problems. Therefore, it is essential to be 
able to measure very accurately the state of polarization of optical signals 
and the polarization-mode dispersion of optical components. It is also highly 
desirable to be able to do these measurements in real time. The HP 8509B lightwave 
polarization analyzer (page  27) is used in these 
cases. In addition, in high-performance systems, requirements on optical back-reflections 
are more severe. Fundamental fiber-optic test equipment like the HP 8156A optical 
attenuator (page  34) must be designed 
to these more exacting tolerances. To measure low back-reflection levels, the 
HP 8504B precision reflectometer (page
39) can be used. A high-performance 
light-emitting diode (page  43) makes it possible 
for the reflectometer to measure -80-dB back-reflections-as little as 1 picowatt 
of reflected power-with a spatial resolution of 50 micrometers. At high data 
rates, system timing accuracy becomes increasingly important. The HP 71501B 
jitter and eye diagram analyzer (page  49) is capable of making 
jitter measurements at rates up to 10 gigabits per second.
 Monitoring network integrity becomes more complex in higher-capacity systems. 
The HP 81700 remote fiber test system (page
 57) helps guard against 
breaks in the fiber causing outages. The system can monitor many fibers at 
once, even at different sites, while they are carrying live traffic. If a fiber 
break occurs, the system generates signals and alarms indicating the location 
of the fault.
 The development of lightwave test and measurement products requires a solid 
photonics technology base. In addition to the quantum-well lasers and LEDs 
mentioned above, HP Laboratories is working on other devices and subsystems 
for future products. A highly stable, miniature laser using YVO (yttrium orthovanadate) 
crystals operating at a center frequency of 282 terahertz (page
 63) is an example of 
excellent low-noise optical sources. The recent development of surface emitting 
lasers (page
 67) is very promising 
for a variety of applications such as optical interconnect systems for data 
communications and generating visible light using complex laser structures 
(page
 72).
The technologies and products described in this issue show HP's strength and 
core competency in the area of photonics and lightwaves. A key element of the 
company's strength in lightwave test and measurement is the strong and healthy 
coupling between the research teams at HP Laboratories and the manufacturing 
divisions: the Lightwave Operation at Santa Rosa, California and the Boblingen 
Instruments Division in Germany. 
 Waguih Ishak, Manager Photonics Technology Department, HP Laboratories
Roger Jungerman, Engineer/Scientist, Lightwave Operation                     Also in this IssueAutomatic test systems for digital components, boards, and systems generally 
contain a test pattern sequencer, a module that applies the test signals to 
the device under test and receives the device's responses. However, the traditional 
sequencer architecture has proved inadequate for testing many devices that 
operate on serial bit streams. One of the authors of the article on page
 76 recalls writing a 
test for such a device using a traditional sequencer that required three months 
and 13,000 lines of source code and tested only a fraction of the device's 
functionality. Realizing that a new sequencer architecture was needed for testing 
serial-oriented devices, engineers at HP's Manufacturing Test Division first 
developed a generic model of a serial communication system. Based on their 
analysis of the model, they then designed a new serial test sequencer architecture 
for the HP 3070 family of board test systems. The architecture features modules 
called reconfigurable bit processors, which the engineers have dubbed circuitware because they're neither hardware nor software. A new Serial Test Language was 
written to simplify test programming. The article on page
 76describes all of 
these developments and presents several case studies of customer applications 
that show dramatic improvements in test development time, test coverage, throughput, 
and equipment requirements.
Four papers in this issue are from the 1994 HP Design Technology Conference, 
a forum for the exchange of ideas, best practices, and results among HP engineers 
involved in the development and application of integrated circuit design technologies. 
The theme for the conference was "Accelerating Integration." * To shorten the 
time it takes to put high-performance ASICs (application-specific integrated 
circuits) into production, one design group developed coding guidelines and 
a process for generating wire load models (page
 91). The coding guidelines 
head off later problems and the wire load models are conservative enough to 
make routing easy without sacrificing performance. **  As IC features become 
smaller and chips become more densely packed, on-chip connections have an increasing 
impact on delay times and therefore on performance. Advanced interconnect modeling 
(page  97) is a framework 
that allows designers to model, optimize, and scale circuit delays, including 
both gates and interconnections.
 * While thorough delay testing is necessary 
for high-performance designs, not all circuit paths can be tested for delay. 
The article on page  105 proposes an algorithm 
for synthesizing 100% delay testable circuits. The algorithm uses a method 
called cube partitioning.R.P. Dolan   ** The article on page
 110 compares two fault 
diagnosis methods to determine which does a better job in CMOS circuits. They 
conclude that a bridging fault model with a simple diagnosis algorithm is better 
than a simple stuck-at-0 or stuck-at-1 fault model with a complex algorithm. Editor
 
 |  |