October 1994, Volume 45, Issue 5 Articles
	Customer-Driven Development of a New High-Performance Data Acquisition System, by Von C. Campbell
	A Compact and Flexible Signal Conditioning System for Data Acquisition, by John M. da Cunha
	High-Throughput Amplifier and Analog-to-Digital Converter, by Ronald J. Riedel
	On-the-Fly Engineering Units Conversion, by Christopher P.J. Kelly
	Built-In Self-Test and Calibration for a Scanning Analog-to-Digital Converter, by Gerald I. Raak and Christopher P.J.
	Manufacturing Test Optimization for VXI-Based Scanning Analog-to-Digital Converters, by Bertram S. Kolts and Rodney K. Village
	Design Leverage and Partnering in the Design of a Pressure Scanning Analog-to-Digital Converter by Richard E. Warren and Conrad R. Proft
	Integrated Pin Electronics for Automatic Test Equipment, by James W. Grace, David M. DiPietro, Akito Kishida, and Kenji Kinsho
	CMOS Programmable Delay Vernier by Masaharu Goto, James O. Barnes, and Ronnie E. Owens
	Real-Time Digital Signal Processing in a Mixed-Signal LSI Test System, by Keita Gunji
	Vector Error Testing by Automatic Test Equipment, by Koji Karube
	High-Frequency Impedance Analyzer by Takanori Yonekura
	Virtual Remote: The Centralized Expert, by Hamish Butler
	Frame Relay Conformance Testing, by Martin Dubuc
	The FDDI Ring Manager for the HP Network Advisor Protocol Analyzer, by Sunil Bhat, Robert H. Kroboth, and Anne L. Driesbach
	FDDI Topology Mapping by Sunil Bhat
	Automation of Electrical Overstress Characterization for Semiconductor Devices, by Carlos H. Diaz