HP Labs Technical Reports

High-Frequency Photodiode Characterization using a Filtered Intensity Noise Technique

Baney, Doug M.; Sorin, Wayne V.; Newton, Steve A.

HPL-94-46

Keyword(s):

Abstract: Optical filtering of amplified spontaneous emission improves measurement dynamic range for frequency response measurements of optoelectronic receivers. For high bandwidth receivers, a novel etalon filtered intensity noise technique is proposed. Response measurements using these techniques on a 3 GHz and 30 GHz receiver are demonstrated.

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