HP Labs Technical Reports

Simultaneous Thickness and Group Index Measurement Using Optical Low-Coherence Reflectometry

Sorin, Wayne V.; Gray, D. F.

HPL-91-166

Keyword(s):

Abstract: Using high resolution optical reflectometry, group index and physical thickness can both be determined by precisely measuring optical time delays through a sample. Optical low-coherence reflectometry offers both the high spatial resolution and large dynamic range required to perform accurate measurements using this technique.

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